High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry.
Identifieur interne : 000165 ( Main/Exploration ); précédent : 000164; suivant : 000166High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry.
Auteurs : RBID : pubmed:24365940Abstract
A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies (≤1 kHz). The calorimeter was used for high-resolution thermal imaging of nanogram-sized samples subjected to X-ray-induced heating. For a 46 ng indium particle, the measured temperature rise reaches ∼0.2 K, and is directly correlated to the X-ray absorption. Thermal imaging can be useful for studies of heterogeneous materials exhibiting physical and/or chemical transformations. Moreover, the technique can be extended to three-dimensional thermal nanotomography.
DOI: 10.1107/S1600577513024892
PubMed: 24365940
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Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057</wicri:regionArea><placeName><region type="region" nuts="2">Alsace</region></placeName></affiliation></author><author><name sortKey="Hernandez, Jaime J" uniqKey="Hernandez J">Jaime J Hernandez</name><affiliation wicri:level="3"><nlm:affiliation>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057</wicri:regionArea><placeName><region type="region" nuts="2">Alsace</region></placeName></affiliation></author><author><name sortKey="Odarchenko, Yaroslav I" uniqKey="Odarchenko Y">Yaroslav I Odarchenko</name><affiliation wicri:level="3"><nlm:affiliation>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057, France.</nlm:affiliation><country 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xml:lang="fr">France</country><wicri:regionArea>European Synchrotron Radiation Facility, 6 rue Jules Horowitz, Grenoble 38043</wicri:regionArea><placeName><region type="region" nuts="2">Rhône-Alpes</region></placeName></affiliation></author><author><name sortKey="Spitzer, Denis" uniqKey="Spitzer D">Denis Spitzer</name><affiliation wicri:level="3"><nlm:affiliation>Institut Franco-Allemand de Recherches de Saint-Louis, Laboratoire des Nanomatériaux pour les Systèmes Sous Sollicitations Extrêmes, UMR3208, ISL/CNRS, 5 Rue du Général Cassagnou, Saint-Louis 68301, France.</nlm:affiliation><country xml:lang="fr">France</country><wicri:regionArea>Institut Franco-Allemand de Recherches de Saint-Louis, Laboratoire des Nanomatériaux pour les Systèmes Sous Sollicitations Extrêmes, UMR3208, ISL/CNRS, 5 Rue du Général Cassagnou, Saint-Louis 68301</wicri:regionArea><placeName><region type="region" nuts="2">Alsace</region></placeName></affiliation></author><author><name sortKey="Antipov, A E" uniqKey="Antipov A">A E Antipov</name><affiliation wicri:level="1"><nlm:affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</nlm:affiliation><country xml:lang="fr">Russie</country><wicri:regionArea>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991</wicri:regionArea></affiliation></author><author><name sortKey="Aldoshin, L S" uniqKey="Aldoshin L">L S Aldoshin</name><affiliation wicri:level="1"><nlm:affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</nlm:affiliation><country xml:lang="fr">Russie</country><wicri:regionArea>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991</wicri:regionArea></affiliation></author><author><name sortKey="Ivanov, Dimitri A" uniqKey="Ivanov D">Dimitri A Ivanov</name><affiliation wicri:level="1"><nlm:affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</nlm:affiliation><country xml:lang="fr">Russie</country><wicri:regionArea>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991</wicri:regionArea></affiliation></author></titleStmt><publicationStmt><date when="2014">2014</date><idno type="doi">10.1107/S1600577513024892</idno><idno type="RBID">pubmed:24365940</idno><idno type="pmid">24365940</idno><idno type="wicri:Area/Main/Corpus">000239</idno><idno type="wicri:Area/Main/Curation">000239</idno><idno type="wicri:Area/Main/Exploration">000165</idno></publicationStmt></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies (≤1 kHz). The calorimeter was used for high-resolution thermal imaging of nanogram-sized samples subjected to X-ray-induced heating. For a 46 ng indium particle, the measured temperature rise reaches ∼0.2 K, and is directly correlated to the X-ray absorption. Thermal imaging can be useful for studies of heterogeneous materials exhibiting physical and/or chemical transformations. Moreover, the technique can be extended to three-dimensional thermal nanotomography.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="In-Process"><PMID Version="1">24365940</PMID><DateCreated><Year>2013</Year><Month>12</Month><Day>24</Day></DateCreated><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1600-5775</ISSN><JournalIssue CitedMedium="Internet"><Volume>21</Volume><Issue>Pt 1</Issue><PubDate><Year>2014</Year><Month>Jan</Month></PubDate></JournalIssue><Title>Journal of synchrotron radiation</Title><ISOAbbreviation>J Synchrotron Radiat</ISOAbbreviation></Journal><ArticleTitle>High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry.</ArticleTitle><Pagination><MedlinePgn>223-8</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1107/S1600577513024892</ELocationID><Abstract><AbstractText>A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies (≤1 kHz). The calorimeter was used for high-resolution thermal imaging of nanogram-sized samples subjected to X-ray-induced heating. For a 46 ng indium particle, the measured temperature rise reaches ∼0.2 K, and is directly correlated to the X-ray absorption. Thermal imaging can be useful for studies of heterogeneous materials exhibiting physical and/or chemical transformations. Moreover, the technique can be extended to three-dimensional thermal nanotomography.</AbstractText></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Rosenthal</LastName><ForeName>Martin</ForeName><Initials>M</Initials><Affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</Affiliation></Author><Author ValidYN="Y"><LastName>Doblas</LastName><ForeName>David</ForeName><Initials>D</Initials><Affiliation>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Hernandez</LastName><ForeName>Jaime J</ForeName><Initials>JJ</Initials><Affiliation>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Odarchenko</LastName><ForeName>Yaroslav I</ForeName><Initials>YI</Initials><Affiliation>Institut de Sciences des Matériaux de Mulhouse, CNRS UMR7361, CNRS, 15 rue Jean Starcky, Mulhouse 68057, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Burghammer</LastName><ForeName>Manfred</ForeName><Initials>M</Initials><Affiliation>European Synchrotron Radiation Facility, 6 rue Jules Horowitz, Grenoble 38043, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Di Cola</LastName><ForeName>Emanuela</ForeName><Initials>E</Initials><Affiliation>European Synchrotron Radiation Facility, 6 rue Jules Horowitz, Grenoble 38043, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Spitzer</LastName><ForeName>Denis</ForeName><Initials>D</Initials><Affiliation>Institut Franco-Allemand de Recherches de Saint-Louis, Laboratoire des Nanomatériaux pour les Systèmes Sous Sollicitations Extrêmes, UMR3208, ISL/CNRS, 5 Rue du Général Cassagnou, Saint-Louis 68301, France.</Affiliation></Author><Author ValidYN="Y"><LastName>Antipov</LastName><ForeName>A E</ForeName><Initials>AE</Initials><Affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</Affiliation></Author><Author ValidYN="Y"><LastName>Aldoshin</LastName><ForeName>L S</ForeName><Initials>LS</Initials><Affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</Affiliation></Author><Author ValidYN="Y"><LastName>Ivanov</LastName><ForeName>Dimitri A</ForeName><Initials>DA</Initials><Affiliation>Faculty of Fundamental Physical and Chemical Engineering, Moscow State University, Moscow 119991, Russian Federation.</Affiliation></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType><PublicationType>Research Support, Non-U.S. Gov't</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2013</Year><Month>11</Month><Day>02</Day></ArticleDate></Article><MedlineJournalInfo><Country>Denmark</Country><MedlineTA>J Synchrotron Radiat</MedlineTA><NlmUniqueID>9888878</NlmUniqueID><ISSNLinking>0909-0495</ISSNLinking></MedlineJournalInfo><CitationSubset>IM</CitationSubset><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">indium</Keyword><Keyword MajorTopicYN="N">micro-focus X-ray diffraction</Keyword><Keyword MajorTopicYN="N">modulated differential scanning calorimetry</Keyword><Keyword MajorTopicYN="N">nanocalorimetry</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2013</Year><Month>5</Month><Day>03</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2013</Year><Month>9</Month><Day>06</Day></PubMedPubDate><PubMedPubDate PubStatus="epublish"><Year>2013</Year><Month>11</Month><Day>02</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2013</Year><Month>12</Month><Day>25</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2013</Year><Month>12</Month><Day>25</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2013</Year><Month>12</Month><Day>25</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pii">S1600577513024892</ArticleId><ArticleId IdType="doi">10.1107/S1600577513024892</ArticleId><ArticleId IdType="pubmed">24365940</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
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